Thermal and Thermomechanical Analysis and Testing of Electronic Packaging Systems

نویسندگان

  • GUY V. CLATTERBAUGH
  • HARRY K. CHARLES
چکیده

A comprehensive thermal and mechanical modeling and experimentation program in advanced packaging has led to the systematic thermomechanical analysis of very large scale integrated device packages, board-level structures, and surface-mounted electronic systems. Model validation and analytical results have been correlated with data from extensive experimental testing, and new techniques have been developed for the production of high-reliability, controlled-geometry solder joints for large leadless ceramic chip carriers.

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تاریخ انتشار 2015